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The Fast Access Controller is a sophisticated IP solution aimed at enhancing Design-for-Test capabilities and increasing support for Flash programming in production environments. The FAC bridges crucial components such as microcontrollers, ASICs, and SoCs with the flash memory, facilitating accelerated programming over the 1149.1 bus. Its key innovation is in supporting rapid reconfiguration and sophisticated debugging, lowering the barriers to efficient product development cycles.
The Scan Ring Linker IP serves to simplify the design complexities involved in dealing with multiple scan chains. Intended for easy embedding in ASICs, FPGAs, or CPLDs, the SRL unifies multiple test paths into a single high-speed JTAG interface. This not only conserves valuable design resources but also ensures that secondary scan paths receive due attention in both testing and configuration processes. By alleviating the need for excessive hardware components and offering a seamless integration path, the SRL optimizes resource allocation and enhances overall design efficiency.
SystemBIST is an advanced plug-and-play IC designed for the flexible configuration of FPGA and embedded JTAG tests. It stands out as a vendor-independent device capable of configuring any IEEE 1532 or 1149.1 standard-compliant FPGA directly in the field. With a focus on cutting down configuration PROM costs, SystemBIST stores compressed test scripts in FLASH memory, facilitating access to ready-to-run built-in tests at power-up. The device also ensures effective security against FPGA tampering and unauthorized field updates, reinforcing its utility in high-security applications.
The Eclipse Test Development Environment offers a holistic solution for the test, debug, and configuration of complex PCB systems utilizing JTAG standards. Designed to streamline the testing pipeline, it automates the generation of test patterns and supports in-system device programming and configuration tasks. Eclipse features an intuitive GUI, supporting schematic-based debugging and comprehensive digital fault coverage, thus shortening development cycles and reducing costs in system bring-up and manufacturing.
The TEST-IP Family is a collection of patented infrastructure components that streamline the JTAG test and configuration process for system designs. Designed to be embedded into ICs or loaded onto FPGAs, this IP facilitates high-quality self-testing and in-the-field reconfiguration of products. By decoupling support infrastructure from functional design, TEST-IP streamlines design updates across product generations without re-integration efforts. Utilizing IEEE 1149.1, the IP provides a unified solution for configuration, manufacturing testing, and Field In-System Programming (FISP), enhancing product value by minimizing test costs and simplifying support.
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