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Intellitech Corp.

Intellitech Corp. establishes itself as a leader in the field of semiconductor IP, with a robust focus on innovative test and configuration solutions for complex PCB and system designs. Their patented TEST-IP family facilitates high-quality, self-testable, and field-reconfigurable products by leveraging the IEEE 1149.1 standard, commonly known as JTAG. This approach allows for a streamlined design flow that eliminates the need for traditional ad-hoc mechanisms, effectively reducing product costs and development time. The company's cutting-edge infrastructure IP, known as Eclipse, provides design and test engineers with a comprehensive toolset to develop, validate, and deploy JTAG-based system configurations and test suites. With Eclipse, Intellitech's focus is on providing solutions that are cost-effective and improve time-to-market while enhancing product reliability. These solutions are optimized for both concurrent and sequential operations, supporting a wide range of IC, memory interconnect, and logic tests within a unified framework. Intellitech's innovation extends beyond mere testing to include elements of in-system programming and reconfiguration, empowering their customers to achieve failsafe product updates and secure configurations via the SystemBIST processor. This processor merges configuration capabilities with manufacturing tests, further underscoring Intellitech's emphasis on versatile and adaptive IP products. With a dedication to high-volume digital test environments, the company's solutions like the PT100 Parallel Tester harness patented technologies to maximize efficiency in simultaneous testing and configuration processes. This makes them a reliable partner in addressing the challenges of modern production lines, ensuring robust test coverage and quality results across a diverse range of applications. Read more

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5
IPs available

Fast Access Controller (FAC)

The Fast Access Controller is a sophisticated IP solution aimed at enhancing Design-for-Test capabilities and increasing support for Flash programming in production environments. The FAC bridges crucial components such as microcontrollers, ASICs, and SoCs with the flash memory, facilitating accelerated programming over the 1149.1 bus. Its key innovation is in supporting rapid reconfiguration and sophisticated debugging, lowering the barriers to efficient product development cycles.

Intellitech Corp.
AMBA AHB / APB/ AXI, Embedded Memories, LCD Controller, MIL-STD-1553, SDRAM Controller, USB
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Scan Ring Linker (SRL)

The Scan Ring Linker IP serves to simplify the design complexities involved in dealing with multiple scan chains. Intended for easy embedding in ASICs, FPGAs, or CPLDs, the SRL unifies multiple test paths into a single high-speed JTAG interface. This not only conserves valuable design resources but also ensures that secondary scan paths receive due attention in both testing and configuration processes. By alleviating the need for excessive hardware components and offering a seamless integration path, the SRL optimizes resource allocation and enhances overall design efficiency.

Intellitech Corp.
AMBA AHB / APB/ AXI, Clock Generator, Input/Output Controller, SDRAM Controller
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SystemBIST

SystemBIST is an advanced plug-and-play IC designed for the flexible configuration of FPGA and embedded JTAG tests. It stands out as a vendor-independent device capable of configuring any IEEE 1532 or 1149.1 standard-compliant FPGA directly in the field. With a focus on cutting down configuration PROM costs, SystemBIST stores compressed test scripts in FLASH memory, facilitating access to ready-to-run built-in tests at power-up. The device also ensures effective security against FPGA tampering and unauthorized field updates, reinforcing its utility in high-security applications.

Intellitech Corp.
IEEE1588, MIL-STD-1553, Other, PowerPC, SDRAM Controller, USB
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Eclipse Test Development Environment

The Eclipse Test Development Environment offers a holistic solution for the test, debug, and configuration of complex PCB systems utilizing JTAG standards. Designed to streamline the testing pipeline, it automates the generation of test patterns and supports in-system device programming and configuration tasks. Eclipse features an intuitive GUI, supporting schematic-based debugging and comprehensive digital fault coverage, thus shortening development cycles and reducing costs in system bring-up and manufacturing.

Intellitech Corp.
Arbiter, Audio Controller, SDRAM Controller, Timer/Watchdog
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TEST-IP Family

The TEST-IP Family is a collection of patented infrastructure components that streamline the JTAG test and configuration process for system designs. Designed to be embedded into ICs or loaded onto FPGAs, this IP facilitates high-quality self-testing and in-the-field reconfiguration of products. By decoupling support infrastructure from functional design, TEST-IP streamlines design updates across product generations without re-integration efforts. Utilizing IEEE 1149.1, the IP provides a unified solution for configuration, manufacturing testing, and Field In-System Programming (FISP), enhancing product value by minimizing test costs and simplifying support.

Intellitech Corp.
Input/Output Controller, Interrupt Controller, SDRAM Controller, USB
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