TwinBit Gen-1 is an embedded non-volatile memory solution designed for 180nm to 55nm CMOS logic processes. Known for its high endurance, TwinBit Gen-1 supports more than 10,000 program and erase cycles, making it exceptionally durable. This solution is easily integrated into advanced nodes without the need for additional masks or process alterations, and it spans a memory size range from 64 bits to 512K bits, suitable for applications like analog trimming and security key storage. TwinBit Gen-1 offers benefits such as minimal silicon area requirements and low power operations, making it perfect for automotive applications given its compliance with AEC-Q100 standards. Its built-in test circuits facilitate stress-free test environments, ensuring reliable performance across various operational scenarios.
