The TEST-IP Family is a collection of patented infrastructure components that streamline the JTAG test and configuration process for system designs. Designed to be embedded into ICs or loaded onto FPGAs, this IP facilitates high-quality self-testing and in-the-field reconfiguration of products. By decoupling support infrastructure from functional design, TEST-IP streamlines design updates across product generations without re-integration efforts. Utilizing IEEE 1149.1, the IP provides a unified solution for configuration, manufacturing testing, and Field In-System Programming (FISP), enhancing product value by minimizing test costs and simplifying support.
