JTAG Test and Configuration is a solution that provides powerful hardware and software tools for executing IEEE 1149.1 (JTAG) based testing and configuration. It is designed to be used in the production environment where cost-effective high fault coverage is essential. Leveraging boundary-scan technology, it enables efficient testing of IC interconnections, even within complex PCBs, ensuring that digital faults can be isolated and rectified swiftly.
This configuration toolkit supports the execution of IPC test programs that can be seamlessly transitioned from development to production environments. By harnessing the capabilities of the Eclipse Test Development Environment, it allows for the embedding of comprehensive tests directly into designs. Users can manipulate pin states and perform system-wide diagnostics without the need for traditional physical access points like test pads, significantly improving test coverage and accuracy.
JTAG Test and Configuration also integrates with external test tools, blending industry-standard protocols and custom scripting to manage complex test scenarios. This flexibility ensures that even the most intricate assemblies can be tested with minimal setup time, thus improving overall productivity and lowering costs in high-volume manufacturing scenarios.
