Intellitech’s JTAG Test and Configuration solution offers a comprehensive toolkit leveraging boundary-scan technology to enhance design debug, in-system device configuration, and automated test program development. The Eclipse Family products encompass rigorous testing tools that employ the IEEE 1149.1 standard, empowering engineers to execute high-coverage tests efficiently. Through this integrated solution, manufacturers can swiftly move products from development into volume production, while minimizing risk and enhancing product quality. Moreover, this architecture supports streamlined device programming and configuration tasks, greatly reducing manufacturing costs and expediting time-to-market.
